Electron Microscopy and Holography II
Peter W. Hawkes (Eds.)
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
种类:
年:
2002
出版:
1
出版社:
Elsevier, Academic Press
语言:
english
页:
1
ISBN 10:
0120147645
ISBN 13:
9780120147649
系列:
Advances in Imaging and Electron Physics 122
文件:
PDF, 42.63 MB
IPFS:
,
english, 2002