Advances in Imaging and Electron Physics 175
Peter W. Hawkes (Eds.)
Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Key features:
Key features:
* Contributions from leading authorities * Informs and updates on all the latest developments in the field
种类:
年:
2013
出版:
1
出版社:
Academic Press
语言:
english
页:
1
ISBN 10:
012407670X
ISBN 13:
9780124076709
系列:
Advances in Imaging and Electron Physics 175
文件:
PDF, 8.96 MB
IPFS:
,
english, 2013