Testing and Testable Design of High-Density Random-Access Memories
Pinaki Mazumder, Kanad Chakraborty (auth.)种类:
年:
1996
出版社:
Springer US
语言:
english
页:
413
ISBN 10:
1461314518
ISBN 13:
9781461314516
系列:
Frontiers in Electronic Testing 6
文件:
PDF, 10.16 MB
IPFS:
,
english, 1996